- 101097 Series probes
- 0.200" centers
- 50 Ω impedance
- Compliant on both ends
- Bandwidths of 3 GHz for coax probes with shielding plungers
- Bandwidths of 500 MHz for non-shielded designs
- IDI Spring Probe technology
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New Volta 180 supports Wafer Level Packages and Known Good Dies test businesses
The new Volta 180 Series is an advanced WLCSP test solution that expands Volta product line to include the compact 180um pitch, allowing for a higher number of chips to be tested on each wafer. It allows for a fast and reliable testing of wafers to ensure that they meet specifications and perform as they should, which translates into higher quality end products.
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Is it really that hard to improve chip test performance?
In the digital era, semiconductor chips are present in almost every aspect of our lives. Whether it is from microwave ovens to computers, cell phones, computer central processing units, and other electronic devices there are a variety of chips installed.
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Next Generation DaVinci 56 Test Socket
Coaxial Test Solution for IC Testing to 67 GHz / 56 Gbps
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Smiths Interconnect awards top distributors for 2022
The distribution award initiative recognizes and celebrates the business partners whose efforts have contributed to advancing Smiths Interconnect’s business respectively in the Americas, EMEA and Asia. Winners were selected as best performing distributors in terms of sales growth compared to the previous year.