A Tip- 90° Concave
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- Used to test long leads, terminals, and wire wrap posts.
- Contamination and debris can be trapped in the concave area resulting in false failures.
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B Tip - 30° Spear (Steel Option)
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- Used to test lands, pads, and plated through holes.
- At low spring forces, the spear point is ideal for penetrating thin layers of oxides or contaminates Higher spring forces can be used for thicker layers.
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C Tip - Flat
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- Used to test fold edge fingers and gold pads.
- Leaves no witness marks or indentations on UUT.
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D Tip - Spherical Radius
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- Used to test gold edge fingers or gold pads.
- Leaves no witness marks or indentations on UUT.
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E Tip - 90° Convex
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- Used to test plated through holes, pads, and lands.
- The smooth cone shaped head allows plated through holes to be tested with minimal witness marks to UUT
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F Tip - Flat
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- The point of the tip is used to test pads and lands. Used to test gold edge fingers and gold pads.
- Leaves no witness marks or indentations on UUT.
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G Tip - Concave
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- Used to test long leads, terminals, and wire wrap posts.
- Contamination and debris can be trapped in the concave area resulting in false failures
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H Tip - Serrated (Steel Option)
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- The serrated tip makes reliable contact with long leads and terminals in the grooved area.
- The 9-point tip provides reliable contact on pads and lands.
- Universal tip style.
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HL Tip - 21 Point Serrated
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- The oversized serrated head allows reliable contact with mispositioned targets such as leads and connector terminals.
- When used for large pads, the large contact area with multiple current paths provides low resistance
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HSIC - Serrated with Insulating Cap
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- The oversized serrated head allows reliable contact with mispositioned targets such as leads and connector terminals.
- When used for large pads, the large contact area with multiple current paths provides low resistance.
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HS Tip - Serrated
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- Allows testing of small pads and short leads.
- Multiple contact points provide great stability, minimal marking, and low resistance.
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JS Tip - Spherical Radius
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- Used to test gold edge fingers and gold pads.
- Leaves no witness marks or indentations on UUT
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J Tip - Spherical Radius
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- Used to test gold edge fingers and gold pads.
- Leaves no witness marks or indentations on UUT.
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K Tip - 45° 4-Sided Chisel
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- Used to test plated through holes, pads, and lands.
- The four sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.
- The tip of the chisel contacts the lands and pads.
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LM Tip - 90° Star
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- Used to test plated through holes, lands, and pads.
- The six sharp edges wipe oxides and contaminants in the plated through holes.
- The tip contacts the lands and pads.
- When used with the ROTATORTM Spring Contact Probe, the head cuts through oxides and contaminants.
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M Tip - Headless Blade (Steel Option)
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- The sharp headless blade penetrates contaminants, solder masks and conformal coatings on pads, filled and unfilled vias.
- The knife-like edges contact the rim of the unfilled via.
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NT - Needle Teeth (Steel Option)
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- Used to test pads, and short leads.
- Sharp teeth cut through contaminants.
- Geometry optimized for strength and stability.
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R Tip - Headed Blade (Steel Option)
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- The sharp headed blade penetrates contaminants, solder masks and conformal coatings on pads, filled and unfilled vias.
- The knife-like edges contact the contaminated rim of the unfilled via.
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S Tip - 60° Chisel (Steel Option)
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- Used to test plated through holes, pads, and lands.
- The sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.
- The tip of the chisel contacts the lands and pads.
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SN Tip - Single Needle (Steel)
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- Used to test pads and filled vias.
- Precision ground to extreme sharpness from a special alloy for high resiliency and strength.
- IDI's strongest tip style for piercing contaminants, solder masks, and conformal coatings
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SP Tip - Chiseled Spear (Steel)
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- The sharp chiseled spear penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.
- The knife-like edges contact contaminated rim of the unfilled via.
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SPB Tip - Blunt Chiseled Spear (Steel)
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- The blunt chiseled spear penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.
- The blunter tip provides good penetration but does not stick in unfilled vias.
- The knife-like edges contact contaminated rim of the unfilled via.
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SW Tip - 4-Sided Arrowhead (Steel)
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- The 4-sided arrowhead penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.
- The knife-like edges contact contaminated rim of the unfilled via.
- The wide angle of two of the edges prevent sticking in unfilled vias.
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SWS Tip -Sharp Arrowhead (Steel)
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- The 4-sided arrowhead penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.
- The knife-like edges contact contaminated rim of the unfilled via.
- The wide angle of two of the edges prevent sticking in unfilled vias.
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T Tip - 60° Chisel (Steel Option)
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- Used to test plated through holes, lands, and pads
- The sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.
- The tip contacts the lands and pads.
- When used with the ROTATORTM Spring Contact Probe, the head cuts through contaminants.
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TN Tip - Tri-Needle (Steel)
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- Used to test contaminated targets or pierce conformal coatings on leads and pads.
- The three extremely durable music wire tips resist bending.
- Available in Size 25 Spring Contact Probe assemblies.
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TX Tip - 3-Point Chiseled Crown
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- A very versatile tip that can be used to test plated through holes, lands, pads and vias.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- Penetrates contaminants and coatings on pads, filled vias, and unfilled vias.
- The edges of the gradual taper are used for testing plated through holes.
- The three points contact the pads and lands
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U Tip - 4-Point Crown (Steel Option)
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- Used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The four points contact the pads or lands
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UR Tip - Reduced 4-Point Crown (Steel)
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- The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias.
- The tapered tip shape allows the probe to pass close to board components.
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UST Tip - 4-Point Tapered Crown (Steel)
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- The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias
- The tapered tip shape allows the probe to pass close to board components.
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UT Tip - 4-Point Tapered Crown
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- The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias.
- The tapered tip shape allows the probe to pass close to board components.
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V Tip - 4-Point Crown
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- Used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The four points contact the pads or lands.
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VLT Tip - 4-Point Crown (Steel)
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- Used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The four points contact the pads or lands.
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VT Tip - 4-Point Crown (Steel)
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- The headed 4-point crown can be used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The four points contact the pads or lands.
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V8 Tip - 8-Point Crown
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- Appropriate for long leads, connector terminals, and round pads or solder fillets.
- Self-cleaning design allows contaminants to fall clear.
- Large tip radius captures long leads and connector terminals.
- Available in Size S-075 Spring Contact Probe assemblies.
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W Tip - 4-Point Crown (Steel Option)
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- Used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The four points contact the pads or lands.
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WO Tip - 4-Point Crown (Steel)
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- Used to test lands, pads and leads.
- Non-self cleaning design is more stable on misalign leads and connector terminals.
- The four points allow stable, low resistance contact with pads.
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X Tip - 4-Point Tapered Crown
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- A very versatile tip that can be used to test plated through holes, leads, lands, and pads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The edges of the gradual taper are used for testing plated through holes.
- The four points contact the pads and lands.
- The inside edges trap the leads.
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Y Tip - Tulip (Steel Option)
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- Used to test long leads, terminals, and wire wrap posts.
- The head is cut to allow contaminates to easily fall-out; self-cleaning.
- The inside edges trap the leads.
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Z Tip - 3-Point Crown (Steel)
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- Used to test lands, pads, and leads.
- The head is cut to allow contaminates to easily fall out; self-cleaning tip.
- The inside edges of the tip trap the leads to make contact.
- The three points contact the pads or lands.
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