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Smiths Connectors offers a wide range of spring contacts and design standards for high quality test sockets providing flexibility and fast delivery for optimal cost/performance ratio.
MarketID in (10) False /us/products/product-catalog/array-pop-test

Array PoP Test

  • Memory-bearing, memory-less and manual test solutions
  • Advanced alignment features for both top and bottom devices
  • Refined analysis tools ensuring production ready solutions
  • Controlled impedance for maximum signal integrity
  • ATE and Manual test capability
MarketID in (10) False /us/products/product-catalog/array-high-speed-test

Array High Speed Test

  • 50 ohm controlled impedance
  • High speed > 40 GHz / 20 Gbps
  • Outstanding thermal properties
  • Extreme rigidity, superior durability
  • Developed for > 0.8 mm pitch
  • Patented technology
MarketID in (10) False /us/products/product-catalog/array-standard-test

Array Standard Test

  • Precision alignment calculation
  • Floating device nesting
  • Customization and flexibility
  • Z-axis tolerance stacking analysis
MarketID in (10) False /us/products/product-catalog/peripheral-strip-test-gutenberg

Peripheral Strip Test - Gutenberg

  • Spring probe contact technology
  • Mixed signals and functionality into single connector
  • Excellent coplanarity
  • Minimized required overdrive
  • Million cycle reliability
MarketID in (10) False /us/products/product-catalog/peripheral-tri-temp-test-celsius

Peripheral Tri-Temp Test - Celsius

  • Resistance < 20mΩ
  • Bandwidths > 10 GHz @ -1dB
  • Temperature rated: -50°C - 175°C
  • Minimal cleaning required
  • Patented technology
  • Suited for tri-temp testing
MarketID in (10) False /us/products/product-catalog/spring-probes

Spring Probes

  • Long cycle life
  • Stable contact resistance
  • Superior compliance
  • Reliable signal integrity